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UNE-EN 15991:2011

$23.40

Testing of ceramic and basic materials – Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

Published By Publication Date Number of Pages
AENOR 2011-03-01 29
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Published Code

AENOR

Published By

Asociación Española de Normalización

Publication Date

2011-03-01

Pages Count

29

Language

English

File Size

460.8 KB

ICS Codes 81.060.10 - Raw materials
UNE-EN 15991:2011
$23.40