{"id":396055,"date":"2024-10-20T04:22:40","date_gmt":"2024-10-20T04:22:40","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-993-1997-2\/"},"modified":"2024-10-26T08:09:29","modified_gmt":"2024-10-26T08:09:29","slug":"ieee-993-1997-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-993-1997-2\/","title":{"rendered":"IEEE 993-1997"},"content":{"rendered":"

Revision Standard – Inactive-Withdrawn. A language useful for describing Automatic Test Equipment (ATE) instrumentation and configurations, as well as Interface Test Adapters (ITA), is defined. Principally intended for testing environments using the ATLAS test language, TEDL can also be used to describe instrumentation in non-ATLAS environments.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nTitle page <\/td>\n<\/tr>\n
3<\/td>\nIntroduction <\/td>\n<\/tr>\n
4<\/td>\nParticipants <\/td>\n<\/tr>\n
6<\/td>\nCONTENTS <\/td>\n<\/tr>\n
8<\/td>\n1. Overview
1.1 Scope
1.2 Purpose
1.3 Application <\/td>\n<\/tr>\n
9<\/td>\n1.4 Relationship to other documents
2. References <\/td>\n<\/tr>\n
10<\/td>\n3. Terminology
3.1 Definitions <\/td>\n<\/tr>\n
11<\/td>\n3.2 Acronyms
3.3 TEDL reserved words <\/td>\n<\/tr>\n
17<\/td>\n4. TEDL overview
4.1 TEDL objectives
4.2 TEDL description <\/td>\n<\/tr>\n
22<\/td>\n5. Interface to the ATLAS test program
5.1 Introduction
5.2 ATLAS-to-TEDL correspondence
5.3 Extensibility
5.4 Examples <\/td>\n<\/tr>\n
26<\/td>\n6. Adaptation model (AM)
6.1 General description
6.2 Relationship to other models
6.3 Adaptation model language (AML) <\/td>\n<\/tr>\n
28<\/td>\n6.4 AML rules <\/td>\n<\/tr>\n
29<\/td>\n7. Configuration model (CM)
7.1 General description
7.2 Relationship to other models
7.3 Configuration model language (CML) <\/td>\n<\/tr>\n
30<\/td>\n7.4 CML rules <\/td>\n<\/tr>\n
31<\/td>\n8. Device model (DM)
8.1 General description
8.2 Relationship to other models
8.3 Device model language (DML) <\/td>\n<\/tr>\n
33<\/td>\n8.4 DML rules <\/td>\n<\/tr>\n
34<\/td>\nAnnex A\u2014Complete formal syntax of TEDL <\/td>\n<\/tr>\n
62<\/td>\nAnnex B\u2014Examples <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard for Test Equipment Description Language (TEDL)<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n1997<\/td>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":396063,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-396055","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/396055","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/396063"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=396055"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=396055"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=396055"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}