{"id":421654,"date":"2024-10-20T06:37:25","date_gmt":"2024-10-20T06:37:25","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-60749-132018-2\/"},"modified":"2024-10-26T12:23:41","modified_gmt":"2024-10-26T12:23:41","slug":"bs-en-iec-60749-132018-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-60749-132018-2\/","title":{"rendered":"BS EN IEC 60749-13:2018"},"content":{"rendered":"

This PART of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.<\/p>\n

The salt atmosphere test is considered destructive.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
6<\/td>\nEnglish
CONTENTS <\/td>\n<\/tr>\n
7<\/td>\nFOREWORD <\/td>\n<\/tr>\n
9<\/td>\n1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus <\/td>\n<\/tr>\n
10<\/td>\n5 Procedure
5.1 Conditioning and maintenance of test chamber
5.2 Initial preconditioning of leads
5.3 Mounting of test specimens <\/td>\n<\/tr>\n
11<\/td>\nFigures
Figure 1 \u2013 Dual-in-line packages with leads attached to, or exiting from package sides(such as side-brazed packages and ceramic dual-in-line packages) <\/td>\n<\/tr>\n
13<\/td>\nFigure 2 \u2013 Packages with leads attached to, or exiting from the opposite side of the lid
Figure 3 \u2013 Packages with leads attached to, or exiting from package sides,parallel to lids (such as flatpacks) <\/td>\n<\/tr>\n
14<\/td>\n5.4 Chamber operation
5.5 Length of test
Figure 4 \u2013 Leadless and leaded chip carriers <\/td>\n<\/tr>\n
15<\/td>\n5.6 Examination
5.7 Failure criteria
5.7.1 Finished product
Table 1 \u2013 Minimum duration of exposure <\/td>\n<\/tr>\n
16<\/td>\n5.7.2 Package elements
6 Summary <\/td>\n<\/tr>\n
17<\/td>\nFigure 5 \u2013 Corrosion area charts <\/td>\n<\/tr>\n
18<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Semiconductor devices. Mechanical and climatic test methods – Salt atmosphere<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2018<\/td>\n20<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":421663,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[573,2641],"product_tag":[],"class_list":{"0":"post-421654","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-31-080-01","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/421654","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/421663"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=421654"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=421654"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=421654"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}